Topic of Interests: [Download CALL FOR PAPER]
Please be noted: All original papers will be submit to IEEE Crosscheck System to check the Multiple Publication and Plagiarism problems, please prepare your paper carefully before submission.
Antennas
Analysis, design, and development of various antennas
Design of wide-band antennas and small antennas
Empirical, theoretical, and computational models of antennas and arrays
Material properties and their applications in new antenna design
Reconfigurable and tunable antennas, optical and nano antennas
Antenna arrays and signal processing for antennas
Wave Propagation
Theoretical and computational methods of predicting wave propagation and sensing
Characterization of propagation channels
Applications of wave propagation (wireless communications, multipath interference, underground communications, biomedical applications, etc.)
Multiple antenna systems for spatial, polarization, pattern and other diversity applications
Measurements
Measurement, instrumentation, specification, and standards of electrical quantities
Measurement techniques for antennas, electromagnetic radiation, propagation, and scattering
Design of microwave absorbers and material characterization
Imaging and sensing using electromagnetic fields and waves
Electromagnetics
Fundamental and advanced theory, analytical, numerical solutions, and CAD
Diffraction, scattering, inverse scattering, polarization, and target identification
Radiation, scattering, radar cross section, propagation, and interaction with all media
Novel electromagnetic materials (metamaterials, electromagnetic bandgap structures)
Microwaves, Millimeter Waves and THz
Solid state circuits, low-noise circuits, and high-power circuits, monolithic integrated circuits passive circuits, packaging, interconnects, MCMs, and MEMS
Ferrite and SAW components, superconducting components and technology
Microwave-Optical design, high speed digital circuits and SI, submillimeter wave techniques
THz technology, measurement and imaging
EMC & EMI
EMC and EMI modeling, EMC test methods in industry, environment, near-field for FF problem solving, near-field probers, and functional safety NF scanning for PCB characterization
|
