Authors are invited to submit contributions in the following areas:

Track I: Measurement and Sensor
Multi measurement theory and method; Laser measurement technology; Electromagnetic measurement and testing;　Measurement and Testing Technology; Controlled volume detection and sensor technology; Sensor networks and multi-information fusion; Wireless sensor; Processed surface detection technology and instrument; Advanced sensors,  actuator and RFID technology; Fault diagnosis and reliability;

Track II: Computer Technology and Information Processing
Computer graphics and video processing; Intelligence and computer vision equipment; Pattern recognition and signal processing; Man-machine interface and information system; Information extraction and processing, retrieval and evaluation; Real time signal processing technology; Adaptive signal processing technology; Communication systems and networks; Object-oriented technology; Machine learning and system design based on Intelligent calculation;

Track III: Control Theory and Applications
Linear and nonlinear system control; Process and motion control;　Adaptive and learning control; Robust and predictive control; Intelligent and optimal control; Multi-agent systems and distributed control; System modeling, analysis and synthesis; Control system computer aided analysis and design; Network system analysis and control; Pattern recognition and Intelligent System;

Track IV: Mechatronics
Digital manufacturing and intelligent manufacturing; Robotics; Machinery manufacturing process detection and control; Embedded systems and micro electromechanical systems technology and applications; Computer integrated manufacturing system; Industrial automation and process control; Intelligent Mechatronics; Distributed control system; Mechatronics and materials processing;